Confirmed Plenary Speakers

Jordi ArbiolCatalan Institution for Research and Advanced Studies (ICREA) and Catalan Institute of Nanoscience and Nanotechnology (ICN2), Barcelona, Spain

"2D Nanostructures at Atomic Scale: From Energy an Environmental Applications to Quantum Devices"


Gerhard Dehm, Department Structure and Nano- / Micromechanics of Materials, Max Planck Institute for Iron Research, Düsseldorf, Germany

"Multi-Element Segregation at BCC Iron Grain Boundaries and Their Impact On Mechanical Properties"


Rafal Dunin-Borkowski, Institute for Microstructure Research (PGI-5) and Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Jülich and RWTH, Aachen University, Germany

"In Situ Scanning Transmission Electron Diffraction of Individual Electrically Biased Ag-In-Sb-Te Phase Change Memory Line Cells"


Rolf Erni, Electron Microscopy Center, Swiss Federal Laboratories for Materials Science and Technology (EMPA), Dübendorf, Switzerland

"Liquid-Phase Atomic-Scale Investigations of Crystal Nucleation, Particle Growth and Core-Shell Formation Using In-Situ Scanning Transmission Electron Microscopy"


Paulo Ferreira, INL and IST, University of Lisbon, Portugal and Department of Mechanical Engineering, University of Texas, Austin TX, USA

"Understanding the Structure of LiMn2O4 by Aberration-Corrected HAADF STEM and Differential Phase Contrast"


Hamish Fraser, Materials Science and Engineering Department and Center for the Accelerated Maturation of Materials (CAMM), Ohio State University, Columbus OH, USA

"Use of Analytical Electron Microscopy to Characterize Microstructure and Develop Transformation Pathways in Compositionally Complex Alloys"


Cécile Hébert, Electron Spectrometry and Microscopy Laboratory, École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

"Quantitative Chemical Analysis of Complex Samples using Analytical TEM and Machine Learning Tools: from Elemental Maps to Phase Segmentation"


Colin Humphreys, School of Engineering and Materials Science, Queen Mary University of London, London and Department fo Materials Science and Metallurgy, Cambridge University, Cambridge, UK

"Making Optoelectronic Devices from Large-Area Transfer-Free MOCVD Graphene: Magnetic Hall Sensors and OLEDs: Electron Microscope Challenges"


Thomas Kelly, Steam Instruments, Inc., Madison WI, USA

"Progress Towards Atomic-Scale Analytical Tomography"


Angus Kirkland, Department of Materials, University of Oxford and Electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, Oxford, UK

"From Millions of Images to a Few Numbers: High speed imaging of Defects and Defect Dynamics in Low Dimensional Materials"


Agnes Kittel, Institute of Experimental Medicine, Eötvös Loránd Research Network, Budapest, Hungary

"Electron Microscopy and the Unsolved Problem Of Extracellular Vesicle Isolation"


Gerald Kothleitner, Institute of Electron Microscopy and Nanoanalysis (FELMI), Graz University of Technology, Graz, Austria

"Applications and Challenges in STEM Inelastic Imaging"


Vlado Lazarov, Department of Physics, University of York, York

"The Role of Atomic Structure of Interfaces and Defects in Thin Films Heterostructures for Spintronic Applications"


Laurence Marks, McCormick School of Engineering, Northwestern University, Evanston IL, USA

"Where did That Charge Come From?"


Joachim Mayer, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Jülich, Germany and RWTH, Aachen University, Aachen, Germany

"The role of correlative CT and TEM investigations in the development of novel Li-ion battery materials"


Peter Nellist, Department of Materials and Corpus Christi College, University of Oxford, Oxford, UK

"2D and 4D STEM Imaging of Beam Sensitive Materials"


Eva Olsson, Department of Physics, Chalmers University of Technology, Gothenburg, Sweden

"In Situ Electron Microscopy Revealing Site Specific Strain Induced Changes in Properties and Structure on the Atomic Scale"


Xiaoqing Pan, Samueli School of Engineering, Irvine Materials Research Institute and Center for Complex and Active materials, UC Irvine, Irvine CA, USA

"Emergent Phonon Phenomena at Interfaces probed by Vibrational EELS"


Jürgen Plitzko, Department of Molecular Structural Biology, Max Planck Institute of Biochemistry (MPIB), Munich, Germany

"Next Generation Sample Preparation for Cryo-Electron Tomography"


Quentin Ramasse, SuperSTEM, Daresbury & School of Chemical and Process Engineering and School of Physics, University of Leeds, Leeds, UK

"Monochromated Electron Energy Loss Spectroscopy in the Scanning Transmission Electron Microscope at High Spatial Resolution"


Christina Scheu, Nanoanalytics and Interfaces, Max Planck Institute for Iron Research, Düsseldorf, Germany

"A Scale Bridging Approach For Analysis of Extended Defects in Thermoelectric Materials: From Electron Channeling Contrast Imaging, Scanning Transmission Electron Microscopy to Atom Probe Tomography"


Robert Sinclair, Department of Materials Science and Engineering, Stanford University, Stanford CA, USA

"Using STEM-EELS to Optimize Gold Nanoparticles for Early Cancer Detection"


Erdmann Spiecker, Institute of Micro- and Nanostructure Research, Department of Materials Science and Engineering, Friedrich Alexander University, Erlangen, Germany

"Seeing Structural Evolution of Organic Molecular Nano-crystallites Using 4D Scanning Confocal Electron Diffraction (4D-SCED)"


Sašo Šturm, Department for Nanostructured Materials, Institute Jožef Stefan, Ljubljana, Slovenia

"Nd-Fe-B Permanent Magnets Ecosystem for a Resilient and Sustainable European Electric Mobility and Renewable Energy Future"


Kazu Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center SANKEN, Osaka University, Osaka, Japan

"Electron Microscopy and Spectroscopy of Low-dimensional Hybrid Materials"


Eric Van Cappellen, Thermo Fisher Scientific, Eindhoven, The Netherlands

"Electron Beam Damage Mitigation Strategies"


Ivan Lazić, Thermo Fisher Scientific, Eindhoven, The Netherlands

"Integrated Differential Phase Contrast (iDPC) STEM for Low Dose Imaging of Beam Sensitive Materials and Cryo Nano Particles at Atomic Resolution"