Confirmed plenary speakers

David Bell, School of Engineering and Applied Sciences, Harvard University, Cambridge MA, USA

"Advancing Topological Materials for Quantum Computing Applications with Electron Microscopy"

Gianluigi Botton, Department of Materials Science and Engineering, McMaster University, Hamilton ON, Canada

Fu-Rong Chen, Department of Engineering and System Science, National Tsing Hua University, Hsinchu City, Taiwan

Miran Čeh, Center for electron microscopy and microanalysis (CEMM) , Jožef Stefan Institute, Ljubljana, Slovenia

Peter Denes, Lawrence Berkeley National Laboratory (LBNL), UC Berkeley, Berkeley CA, USA

Rafal Dunin-Borkowski, Institute for Microstructure Research (PGI-5) and Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Jülich, Germany and RWTH, Aachen University, Aachen, Germany

"Prospects and Challenges for Quantitative High-Resolution Transmission Electron Microscopy"

Rolf Erni, Electron Microscopy Center, Swiss Federal Laboratories for Materials Science and Technology (EMPA), Dübendorf, Switzerland

"Possibilities of Differential Phase Contrast STEM to Study Functional Oxides"

Paulo Ferreira, Department of Advanced Electron Microscopy, Imaging and Spectroscopy, International Iberian Nanotechnology Laboratory, Braga and IST, University of Lisbon, Lisbon, Portugal; University of Texas, Austin TX, USA

"On the degradation of PtNi nanocatalysts for PEM Fuel Cells: An Identical Location aberration-corrected TEM Study"

Hamish Fraser, Materials Science and Engineering Department and Center for the Accelerated Maturation of Materials (CAMM), Ohio State University, Columbus OH, USA

"The Role of Structural Instabilities on Microstructural Evolution in Metastable Beta Titanium Alloys"

Ferdinand Hofer, Austrian Centre for Electron Microscopy and Nanoanalysis (FELMI-ZFE), Graz University of Technology, Graz, Austria

Wolfgang Jäger, Microanalysis of Materials, Institute for Materials Science, University of Kiel, Kiel, Germany

"Advanced and In Situ TEM of Functional Nanomaterials"

Wayne D. Kaplan, Department of Materials Science and Engineering, Technion Israel Institute of Technology, Haifa, Israel

"Incoherent Interfaces: Strain, Adsorption, and Reconstruction"

Thomas Kelly, CAMECA Instruments Inc., AMETEK Inc., Madison WI, USA

Hannes Lichte, Triebenberg Laboratory for Electron Microscopy and Electron Holography, Institute for Structure Physics, Dresden University of Technology, Dresden, Germany

"Electron waves for comprehensive analysis of structures and fields in solids"

Laurence Marks, McCormick School of Engineering, Northwestern University, Evanston CA, USA

"Profile Imaging: 35 years old and still truckin"

Joachim Mayer, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Jülich, Germany and RWTH, Aachen University, Aachen, Germany

Jan Neethling, Centre for High Resolution Transmission Electron Microscopy, Nelson Mandela University, Port Elizabeth, South Africa

"Applying Cs-corrected TEM/STEM to long-standing materials science problems"

Eva Olsson, Department of Physics, Chalmers University of Technology, Gothenburg, Sweden

Stephen Pennycook, Department of Materials Science and Engineering, Faculty of Engineering, National University of Singapore, Singapore

"Materials Under the Microscope: the Atomic Origin of Functionality"

Doug Perović, Ontario Centre for the Characterization of Advanced Materials (OCCAM), University of Toronto, Toronto ON, Canada

Jürgen Plitzko, Department of Molecular Structural Biology, Max Planck Institute of Biochemistry (MPIB), Munich, Germany

Tamara Radetić, Faculty of Technology and Metallurgy, University of Belgrade, Belgrade, Serbia

"Atomic Mechanisms of Grain Boundary Migration in Au Bicrystals"

Robert Sinclair, Department of Materials Science and Engineering, Stanford University, Stanford CA, USA

Erdmann Spiecker, Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science and Engineering, Friedrich Alexander University, Erlangen, Germany

"Scanning Transmission Electron Microscopy and Diffraction in SEM: Novel Approaches and Applications"

Kazu Suenaga, National Institute for Advanced Industrial Science and Technology (AIST), Tokyo, Japan

Maria Varela del Arco, Department of Materials Physics, Faculty of Physical Sciences, Complutense University of Madrid, Madrid, Spain

Johan Verbeeck, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium

"The road towards a versatile programmable phase plate for electrons"

© 2018 Electron Microscopy of Nanostructures ELMINA2018 Conference